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8
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Magazine Name
:
Ieee Design And Test Of Computers
Year :
1997
Volume number :
14
Issue:
01
Designing Ultrasparc For Testability.
(Article)
Subject
:
Ultrasparc Testability
Author:
Marce E Levitt
page:
10 -
17
Mapping And Repairing Embedded-Memory Defects.
(Article)
Subject
:
Memory Defect Mapping
Author:
Siva Paramanandam
page:
18 -
24
Alpha 21164 Testability Strategy.
(Article)
Subject
:
Author:
John H Edmondson Dilip K Bhavsar
page:
25 -
33
Prototyping The M68060 For Concurrent Verfication.
(Article)
Subject
:
Concurrent Verification
Author:
Jainendra Kumar
page:
34 -
41
Nrec: Risk Assessment And Planning Of Complex Designs.
(Article)
Subject
:
Nrec
Author:
Viktor Lapinskii Jainendra Kumar
page:
42 -
49
Testing Logic-Intensive Memory Ics On Memory Testers.
(Article)
Subject
:
Memory Testing
Author:
Richard Wheelus Jerry Gerner Robert Wu
page:
50 -
54
Collateral Asic Test.
(Article)
Subject
:
Author:
Al Bailey Tim Lada
page:
55 -
63
Impact Of System Partitioning On Test Cost.
(Article)
Subject
:
System Test Cost
Author:
Yves Le Traon Ghassan Al-Hayek
page:
64 -
74
